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Measuring 01-nm motion in 1 ms in an opt ... tial back-focal-plane detection
Measuring 0.1-nm motion in 1 ms in an optical microscope with differential back-focal-plane detection.
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Back-focal-plane detection of micrometer-sized beads offers subnanometer resolution for single-molecule, optical trapping experiments. However, laser beam-pointing instability and mechanical drift of the microscope limit the resolution of optical-trapping experiments. By combining two infrared lasers with improved differential beam-pointing stability (< or = 0.05 microrad), we simultaneously measure and subtract the motion of the microscope stage, leading to a resolution of <0.1 nm in 1 ms and stability of 0.5 nm over 60 s. Repeated steps of 0.4 nm at 1 Hz are resolved with a signal-to-noise ratio of 25.
Nugent-Glandorf L, Perkins TT
Optics letters
2004-11-15 00:00
29
22
2611-3
Equipment Design,Equipment Failure Analysis,Image Enhancement,Image Interpretation, Computer-Assisted,Micromanipulation,Microscopy,Motion,Nanotechnology,Online Systems,Reproducibility of Results,Sensitivity and Specificity,Subtraction Technique
JILA, National Institute of Standards and Technology, Boulder, Colorado 80309-0440, USA
0146-9592
1002
True
15552661
